Atomic Force Microscopy

Attention: open in a new window. PDFPrintE-mail

afmAtomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100Å in diameter. The tip is located at the free end of a cantilever that is 100 to 200μm long. Forces between the tip and the sample surface cause the cantilever to bend, or deflect. A detector measures the cantilever deflection as the tip is scanned over the sample, or the sample is scanned under the tip. The measured cantilever deflections allow a computer to generate a map of surface topography. AFMs can be used to study insulators and semiconductors as well as electrical conductors. Several forces typically contribute to the deflection of an AFM cantilever. The force most commonly associated with atomic force microscopy is an inter-atomic force called the Van der Waals force.


Large multi-purpose scanner:

  • Scanning range: 90 ±m × 90 ±m
  • Z range: 8 ±m

Small scanner:

  • Scanning range: 9 ±m × 9 ±m
  • Z range: 2 ±m
  • Sample plate sizes: Kinematic mount translatable
  • plate 20 mm × 20 mm

Imaging modes:

  • Contact mode
  • Current sensing mode
  • Phase Imaging
  • Force modulation
  • EFM
  • KFM
  • MAC Mode


  • Multi-user research AFM with atomic resolution.
  • Environmental control enables control of humidity, monitoring of oxygen levels and easy introduction and purging of gases in the sample chamber.
  • Temperature control is available with heating of sample up to 250°C and allows imaging during temperature changes.
  • Capability to scan in liquids, gases or ambient air
  • AFM controllers and software allow simultaneous real-time display of up to eight channels.
  • The MAC III controller offers capability to perform multi-channel scanning simultaneously at high resolution.


  • Material Science
  • Electro Chemistry
  • Polymer science
  • Nanolithography
  • Nanografting
  • Life Science
  • Biotechnology
For more information about the manufacturer please visit